RESEARCH OF GARMENTS MATERIAL REFLECTIVITY WITHIN THE RANGE OF MICROWAVE FREQUENCY (SHF)

Authors

  • Olexiy Vaganov Kyiv National University of Technology and Design
  • Youriy Skrypnyk Kyiv National University of Technology and Design
  • Аlexiy Yanenko SRC KM “Vidgyk”

Abstract

Much attention has been paid to the behavior of the different materials in the electromagnetic fields of different intensity. The paper presents the further development of researches of the material reflectivity within the super-high-frequency band (SHF) with the use of the highly sensitive radiometric system (RS) and resonance properties of leather materials for making garments. Authors have developed the structural schema of RS researched the peculiarities of its work.

Author Biographies

Olexiy Vaganov, Kyiv National University of Technology and Design

Post-Graduate student of the Departmrent for Automation and Computer Systems

Youriy Skrypnyk, Kyiv National University of Technology and Design

Professor of the Departmrent for Automation and Computer Systems

Аlexiy Yanenko, SRC KM “Vidgyk”

Deputy Director on Scientific work

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How to Cite

[1]
O. Vaganov, Y. Skrypnyk, and Yanenko А., “RESEARCH OF GARMENTS MATERIAL REFLECTIVITY WITHIN THE RANGE OF MICROWAVE FREQUENCY (SHF)”, Works of VNTU, no. 1, Dec. 2011.

Issue

No. 1 (2007): 2007№1

Section

Radioelectronics and Radioelectronic Equipment Design

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