Kychak, Vasyl, Dmytro Myhalvskyy, and Oleg Krypskyy. “NOISE MODEL OF FET FOR FORECASTING THEIR RELIABILITY ON LEVEL OF LF NOISE”. Scientific Works of Vinnytsia National Technical University, no. 4 (December 1, 2015). Accessed April 19, 2024. https://works.vntu.edu.ua/index.php/works/article/view/189.