KYCHAK, V.; MYHALVSKYY, D.; KRYPSKYY, O. NOISE MODEL OF FET FOR FORECASTING THEIR RELIABILITY ON LEVEL OF LF NOISE. Scientific Works of Vinnytsia National Technical University, [S. l.], n. 4, 2015. Disponível em: https://works.vntu.edu.ua/index.php/works/article/view/189. Acesso em: 6 dec. 2022.